Atomic Force Microscope

The AFM-1000 is an atomic-force microscope, which uses a scanning probe for various modes of monochromatic imaging. The system can resolve to 0.2nm, which far surpasses the limitations of optical microscopes by approximately 1000X. The scanning process uses three-dimensional movement up to 20µm laterally, and 2µm vertically. The probe can be used for both contact and tapping modes, depending on the nature of the sample. Contact mode provides a force-measurement of the sample surface, resulting in high resolutions, but biased by friction and adhesion. Tapping modes avoid friction and adhesion through intermittent-contact. Along with topography, the probe can measure magnetic and electrostatic forces.